Taylor, Michael A <br/><br/>
Enhanced sensitivity in dark-field microscopy by optimizing the illumination angle.  [electronic resource] 

 -  Applied optics  Aug 2013 
 - 5718-23 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1539-4522 
<br/><br/><label>Standard No.: </label>10.1364/AO.52.005718  doi