Cho, Kyungjune <br/><br/>
Electric stress-induced threshold voltage instability of multilayer MoS2 field effect transistors.  [electronic resource] 

 -  ACS nano  Sep 2013 
 - 7751-8 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1936-086X 
<br/><br/><label>Standard No.: </label>10.1021/nn402348r  doi