Zhang, Chao <br/><br/>
The use of a central beam stop for contrast enhancement in TEM imaging.  [electronic resource] 

 -  Ultramicroscopy  Nov 2013 
 - 200-6 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2013.05.019  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Graphite--chemistry<br/>Microscopy, Electron, Transmission--methods