Sun, Jong-Won <br/><br/>
Reduction process of dislocation and standby leakage current for embedded flash memory using nano-scale integration.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Jun 2013 
 - 4291-6 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1533-4880 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2013.7172  doi