Wang, Ying <br/><br/>
Dependencies of microstructure and stress on the thickness of GdBa2Cu3O7 - δ thin films fabricated by RF sputtering.  [electronic resource] 

 -  Nanoscale research letters  Jul 2013 
 - 304 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1931-7573 
<br/><br/><label>Standard No.: </label>10.1186/1556-276X-8-304  doi