Teschke, Omar <br/><br/>
Water exclusion layers probed by depth scan confocal Raman microscopy.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  Oct 2013 
 - 1317-22 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1435-8115 
<br/><br/><label>Standard No.: </label>10.1017/S1431927613001827  doi