Ruggles, T J <br/><br/>
Estimations of bulk geometrically necessary dislocation density using high resolution EBSD.  [electronic resource] 

 -  Ultramicroscopy  Oct 2013 
 - 8-15 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2013.04.011  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrons<br/>Microscopy, Electron, Transmission--methods