Liu, Han <br/><br/>
Statistical study of deep submicron dual-gated field-effect transistors on monolayer chemical vapor deposition molybdenum disulfide films.  [electronic resource] 

 -  Nano letters  Jun 2013 
 - 2640-6 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1530-6992 
<br/><br/><label>Standard No.: </label>10.1021/nl400778q  doi