TY  - GEN
AU  - Maragliano,C
AU  - Heskes,D
AU  - Stefancich,M
AU  - Chiesa,M
AU  - Souier,T
TI  - Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution
SN  - 1361-6528
PY  - 2013///1203
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1088/0957-4484/24/22/225703
ER  -