Maragliano, C <br/><br/>
Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution.  [electronic resource] 

 -  Nanotechnology  Jun 2013 
 - 225703 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/24/22/225703  doi