TY  - GEN
AU  - Seo,M
AU  - Boubanga-Tombet,S
AU  - Yoo,J
AU  - Ku,Z
AU  - Gin,A V
AU  - Picraux,S T
AU  - Brueck,S R J
AU  - Taylor,A J
AU  - Prasankumar,R P
TI  - Ultrafast optical wide field microscopy
SN  - 1094-4087
PY  - 2013///0919
KW  - Equipment Design
KW  - Equipment Failure Analysis
KW  - Image Enhancement
KW  - instrumentation
KW  - Microscopy
N1  - Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S
UR  - https://doi.org/10.1364/OE.21.008763
ER  -