Taleei, Reza <br/><br/>
The non-homologous end-joining (NHEJ) mathematical model for the repair of double-strand breaks: II. Application to damage induced by ultrasoft X rays and low-energy electrons.  [electronic resource] 

 -  Radiation research  May 2013 
 - 540-8 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1938-5404 
<br/><br/><label>Standard No.: </label>10.1667/RR3124.1  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Base Sequence<br/>Carbon--adverse effects<br/>DNA Breaks, Double-Stranded--radiation effects<br/>DNA End-Joining Repair--radiation effects<br/>Electrons--adverse effects<br/>Kinetics<br/>Models, Genetic<br/>X-Rays--adverse effects