Murakami, Yosuke <br/><br/>
In-situ transmission electron microscopy observation of electromigration in Au thin wires.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Nov 2012 
 - 8741-5 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1533-4880 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2012.6813  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electric Conductivity<br/>Electron Transport<br/>Electrons<br/>Gold--chemistry<br/>Materials Testing<br/>Metal Nanoparticles--chemistry<br/>Microscopy, Electron--methods<br/>Particle Size