TY  - GEN
AU  - Kim,Junyeon
AU  - Sinha,Jaivardhan
AU  - Hayashi,Masamitsu
AU  - Yamanouchi,Michihiko
AU  - Fukami,Shunsuke
AU  - Suzuki,Tetsuhiro
AU  - Mitani,Seiji
AU  - Ohno,Hideo
TI  - Layer thickness dependence of the current-induced effective field vector in Ta|CoFeB|MgO
SN  - 1476-4660
PY  - 2013///0426
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1038/nmat3522
ER  -