TY  - GEN
AU  - Li,Meng-Chi
AU  - Wan,Der-Shen
AU  - Lee,Cheng-Chung
TI  - Application of white-light scanning interferometer on transparent thin-film measurement
SN  - 1539-4522
PY  - 2013///1104
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1364/AO.51.008579
ER  -