Li, Meng-Chi <br/><br/>
Application of white-light scanning interferometer on transparent thin-film measurement.  [electronic resource] 

 -  Applied optics  Dec 2012 
 - 8579-86 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1539-4522 
<br/><br/><label>Standard No.: </label>10.1364/AO.51.008579  doi