TY  - GEN
AU  - Sulyok,A
AU  - Toth,A L
AU  - Zommer,L
AU  - Menyhard,M
AU  - Jablonski,A
TI  - Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast
SN  - 1879-2723
PY  - 2013///0815
KW  - Computer Simulation
KW  - Electrons
KW  - Microscopy, Electron, Scanning
KW  - methods
KW  - Monte Carlo Method
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1016/j.ultramic.2012.08.004
ER  -