Sulyok, A <br/><br/>
Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast.  [electronic resource] 

 -  Ultramicroscopy  Jan 2013 
 - 88-95 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2012.08.004  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer Simulation<br/>Electrons<br/>Microscopy, Electron, Scanning--methods<br/>Monte Carlo Method