Liu, Zhuang <br/><br/>
Reflection-based near-field ellipsometry for thin film characterization.  [electronic resource] 

 -  Ultramicroscopy  Jan 2013 
 - 26-34 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2012.08.003  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanostructures--ultrastructure<br/>Spectroscopy, Near-Infrared--methods