Bock, Przemek J
Demonstration of a curved sidewall grating demultiplexer on silicon. [electronic resource]
- Optics express Aug 2012
- 19882-92 p. digital
Publication Type: Journal Article
1094-4087
10.1364/OE.20.019882 doi
Equipment Design
Equipment Failure Analysis
Nanotechnology--instrumentation
Refractometry--instrumentation
Silicon--chemistry
Surface Plasmon Resonance--instrumentation
Telecommunications--instrumentation