Bak, Jun Yong <br/><br/>
Effect of the electrode materials on the drain-bias stress instabilities of In-Ga-Zn-O thin-film transistors.  [electronic resource] 

 -  ACS applied materials & interfaces  Oct 2012 
 - 5369-74 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1944-8252 
<br/><br/><label>Standard No.: </label>10.1021/am301253x  doi