TY  - GEN
AU  - Ryoo,Kyung-Chang
AU  - Oh,Jeong-Hoon
AU  - Jung,Sunghun
AU  - Jeong,Hongsik
AU  - Park,Byung-Gook
TI  - Dimensional effect of non-polar resistive random access memory (RRAM) for low-power memory application
SN  - 1533-4880
PY  - 2012///0927
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1166/jnn.2012.6233
ER  -