Shard, Alexander G <br/><br/>
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.  [electronic resource] 

 -  Analytical chemistry  Sep 2012 
 - 7865-73 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1520-6882 
<br/><br/><label>Standard No.: </label>10.1021/ac301567t  doi