TY  - GEN
AU  - Schmucker,S W
AU  - Kumar,N
AU  - Abelson,J R
AU  - Daly,S R
AU  - Girolami,G S
AU  - Bischof,M R
AU  - Jaeger,D L
AU  - Reidy,R F
AU  - Gorman,B P
AU  - Alexander,J
AU  - Ballard,J B
AU  - Randall,J N
AU  - Lyding,J W
TI  - Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography
SN  - 2041-1723
PY  - 2012///1102
N1  - Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S
UR  - https://doi.org/10.1038/ncomms1907
ER  -