Park, Hongsik <br/><br/>
Evaluation of metal-nanowire electrical contacts by measuring contact end resistance.  [electronic resource] 

 -  Nanotechnology  Jun 2012 
 - 245201 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/23/24/245201  doi