TY  - GEN
AU  - Tseng,Yuan Heng
AU  - Shen,Wen Chao
AU  - Lin,Chrong Jung
TI  - Modeling of electron conduction in contact resistive random access memory devices as random telegraph noise
SN  - 0021-8979
PY  - 2012///
PB  - Journal of applied physics
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1063/1.3691224
ER  -