Wang, Xiongyao <br/><br/>
A convenient method for electron tomography sample preparation using a focused ion beam.  [electronic resource] 

 -  Microscopy research and technique  Sep 2012 
 - 1165-9 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1097-0029 
<br/><br/><label>Standard No.: </label>10.1002/jemt.22044  doi