TY  - GEN
AU  - Estradé,Sonia
AU  - Portillo,Joaquim
AU  - Mendoza,Joan
AU  - Kosta,Ivette
AU  - Serret,Maria
AU  - Müller,Carlos
AU  - Peiró,Francesca
TI  - Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction
SN  - 1878-4291
PY  - 2012///0808
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1016/j.micron.2012.03.003
ER  -