Estradé, Sonia <br/><br/>
Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction.  [electronic resource] 

 -  Micron (Oxford, England : 1993)  Aug 2012 
 - 910-5 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1878-4291 
<br/><br/><label>Standard No.: </label>10.1016/j.micron.2012.03.003  doi