TY  - GEN
AU  - Choi,Sungjin
AU  - Lee,Junhyuk
AU  - Kim,Donghyoun
AU  - Oh,Seulki
AU  - Song,Wangyu
AU  - Choi,Seonjun
AU  - Choi,Eunsuk
AU  - Lee,Seung-Beck
TI  - Reduced distribution of threshold voltage shift in double layer NiSi2 nanocrystals for nano-floating gate memory applications
SN  - 1533-4880
PY  - 2012///0320
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1166/jnn.2011.4009
ER  -