Rossell, M D <br/><br/>
Atomic structure of highly strained BiFeO3 thin films.  [electronic resource] 

 -  Physical review letters  Jan 2012 
 - 047601 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1079-7114 
<br/><br/><label>Standard No.: </label>10.1103/PhysRevLett.108.047601  doi