Vashpanov, Yuriy <br/><br/>
Photo-EMF sensitivity of porous silicon thin layer-crystalline silicon heterojunction to ammonia adsorption.  [electronic resource] 

 -  Sensors (Basel, Switzerland)  2011 
 - 1321-7 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1424-8220 
<br/><br/><label>Standard No.: </label>10.3390/s110201321  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Adsorption--radiation effects<br/>Ammonia--analysis<br/>Crystallization<br/>Electrochemical Techniques--instrumentation<br/>Light<br/>Nanowires--chemistry<br/>Nitrogen--analysis<br/>Porosity--radiation effects<br/>Silicon--chemistry<br/>Thermodynamics