Kim, Kyung Min <br/><br/>
Electronic bipolar resistance switching in an anti-serially connected Pt/TiO2/Pt structure for improved reliability.  [electronic resource] 

 -  Nanotechnology  Jan 2012 
 - 035201 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/23/3/035201  doi