Gasseller, M <br/><br/>
Single-electron capacitance spectroscopy of individual dopants in silicon.  [electronic resource] 

 -  Nano letters  Dec 2011 
 - 5208-12 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1530-6992 
<br/><br/><label>Standard No.: </label>10.1021/nl2025163  doi