De Backer, A <br/><br/>
High precision measurements of atom column positions using model-based exit wave reconstruction.  [electronic resource] 

 -  Ultramicroscopy   
 - 1475-82 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2011.07.002  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer Simulation<br/>Image Processing, Computer-Assisted--methods<br/>Likelihood Functions<br/>Microscopy, Electron, Transmission--statistics & numerical data<br/>Models, Theoretical