Anderson, Evan V <br/><br/>
Shape-independent lateral force calibration.  [electronic resource] 

 -  ACS applied materials & interfaces  Sep 2011 
 - 3256-60 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1944-8252 
<br/><br/><label>Standard No.: </label>10.1021/am200770r  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Calibration<br/>Microscopy, Atomic Force--methods<br/>Nanotechnology--methods