Valdrč, Giovanni <br/><br/>
3D finite element analysis of electrostatic deflection of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: I. Triangular shaped cantilevers with symmetric pyramidal tips.  [electronic resource] 

 -  Nanotechnology  Oct 2008 
 - 405501 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0957-4484 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/19/40/405501  doi