TY  - GEN
AU  - Wang,T H
AU  - Yen,S T
TI  - Electronic structure analysis for group III acceptors in Ge under stress considering screening effect and central-cell correction
SN  - 1361-648X
PY  - 2012///1002
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1088/0953-8984/21/33/335801
ER  -