Zatryb, G <br/><br/>
Correlation between stress and carrier nonradiative recombination for silicon nanocrystals in an oxide matrix.  [electronic resource] 

 -  Nanotechnology  Aug 2011 
 - 335703 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/22/33/335703  doi