Jepson, Mark <br/><br/>
Resolution limits of secondary electron dopant contrast in helium ion and scanning electron microscopy.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  Aug 2011 
 - 637-42 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1435-8115 
<br/><br/><label>Standard No.: </label>10.1017/S1431927611000365  doi