Chen, Qing <br/><br/>
Establishing Ohmic contacts for in situ current-voltage characteristic measurements on a carbon nanotube inside the scanning electron microscope.  [electronic resource] 

 -  Nanotechnology  Feb 2006 
 - 1087-98 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0957-4484 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/17/4/041  doi