Döbeli, M <br/><br/>
Characterization of oxide films by MeV ion beam techniques.  [electronic resource] 

 -  Journal of physics. Condensed matter : an Institute of Physics journal  Jul 2008 
 - 264010 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0953-8984 
<br/><br/><label>Standard No.: </label>10.1088/0953-8984/20/26/264010  doi