Chen, Qing <br/><br/>
Fabrication and electric measurements of nanostructures inside transmission electron microscope.  [electronic resource] 

 -  Ultramicroscopy  Jun 2011 
 - 948-54 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Review 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2011.01.043  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electricity<br/>Electrons<br/>Microscopy, Electron, Transmission--methods<br/>Nanostructures--analysis<br/>Nanotechnology--methods