Ielmini, D <br/><br/>
Physical models of size-dependent nanofilament formation and rupture in NiO resistive switching memories.  [electronic resource] 

 -  Nanotechnology  Jun 2011 
 - 254022 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/22/25/254022  doi