TY  - GEN
AU  - Savel'ev,S E
AU  - Alexandrov,A S
AU  - Bratkovsky,A M
AU  - Williams,R Stanley
TI  - Molecular dynamics simulations of oxide memory resistors (memristors)
SN  - 1361-6528
PY  - 2011///0902
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1088/0957-4484/22/25/254011
ER  -