TY  - GEN
AU  - Reece,Peter J
AU  - Toe,Wen Jun
AU  - Wang,Fan
AU  - Paiman,Suriati
AU  - Gao,Qiang
AU  - Tan,H Hoe
AU  - Jagadish,C
TI  - Characterization of semiconductor nanowires using optical tweezers
SN  - 1530-6992
PY  - 2011///0930
KW  - Nanowires
KW  - chemistry
KW  - Optical Tweezers
KW  - Particle Size
KW  - Semiconductors
KW  - Surface Properties
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1021/nl200720m
ER  -