TY  - GEN
AU  - Huang,Qiuping
AU  - Li,Bincheng
TI  - Self-eliminating instrumental frequency response from free carrier absorption signals for silicon wafer characterization
SN  - 1089-7623
PY  - 2011///0830
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1063/1.3577043
ER  -