Huang, Qiuping <br/><br/>
Self-eliminating instrumental frequency response from free carrier absorption signals for silicon wafer characterization.  [electronic resource] 

 -  The Review of scientific instruments  Apr 2011 
 - 043104 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.3577043  doi