TY  - GEN
AU  - Lauritsen,J V
AU  - Reichling,M
TI  - Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces
SN  - 1361-648X
PY  - 2011///0801
KW  - Aluminum Oxide
KW  - chemistry
KW  - Cerium
KW  - Equipment Design
KW  - Metals
KW  - Microscopy, Atomic Force
KW  - instrumentation
KW  - Nanotechnology
KW  - methods
KW  - Surface Properties
KW  - Titanium
KW  - Zinc Oxide
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Review
UR  - https://doi.org/10.1088/0953-8984/22/26/263001
ER  -