Lauritsen, J V <br/><br/>
Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces.  [electronic resource] 

 -  Journal of physics. Condensed matter : an Institute of Physics journal  Jul 2010 
 - 263001 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Review 
<br/><br/><label>ISSN: </label>1361-648X 
<br/><br/><label>Standard No.: </label>10.1088/0953-8984/22/26/263001  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Aluminum Oxide--chemistry<br/>Cerium--chemistry<br/>Equipment Design<br/>Metals--chemistry<br/>Microscopy, Atomic Force--instrumentation<br/>Nanotechnology--methods<br/>Surface Properties<br/>Titanium--chemistry<br/>Zinc Oxide--chemistry